MA: Investigation of correlations between process data, test structure properties and device caracteristics of MOSFETs via machine learning models
Zhifeng Huang
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Art der Arbeit:
Masterarbeit
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Status:
laufend
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Kontakt:
Rommel, Mathias
Dr.-Ing. Saskia Schimmel
Wissenschaftliche Mitarbeitende
Kontakt
Prof. Dr.-Ing. Jörg Schulze
Professorinnen und Professoren