Julian Schwarz
Chair of Electron Devices
Research associates
Address
Cauerstraße 6 91058 ErlangenRoom: 01.156, Floor: 01
Contact
2026
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Probing crystal axis orientation of birefringent materials via polarized microspectroscopy and anisotropic optical modeling
In: JPhys Photonics 8 (2026), p. 015029
ISSN: 2515-7647
DOI: 10.1088/2515-7647/ae2e68
2025
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Fluoride-Induced Corrosion of Stainless Steel: A Case Study for its Application as Proton Exchange Membrane Water Electrolysis Bipolar Plate Material
In: Chemsuschem (2025)
ISSN: 1864-5631
DOI: 10.1002/cssc.202501561 - , , , , , , , , , :
Platinum interlayers reduce charge transport barriers between amorphous Ir-oxide OER electrocatalysts and the porous transport layer
In: Chemical Engineering Journal 514 (2025), Article No.: 162887
ISSN: 1385-8947
DOI: 10.1016/j.cej.2025.162887 - , , , , :
Modeling the partially detected backside reflectance of transparent substrates in reflectance microspectroscopy
In: Micron 198 (2025), p. 103878
ISSN: 0968-4328
DOI: 10.1016/j.micron.2025.103878 - , , , , , , , , , :
Spectro-Spatial Unmixing in Optical Microspectroscopy for Thickness Determination of Layered Materials
In: Advanced Optical Materials 13 (2025), Article No.: 2402502
ISSN: 2195-1071
DOI: 10.1002/adom.202402502
2024
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Simplifying Random Particle Structures within Soft Magnetic Composite Materials for the Optimization of 3D-FEM Simulations
In: IEEE Transactions on Magnetics (2024), p. 1-1
ISSN: 0018-9464
DOI: 10.1109/TMAG.2024.3434611
2023
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Unconventional conductivity increase in multilayer black phosphorus
In: npj 2D Materials and Applications 7 (2023), Article No.: 21
ISSN: 2397-7132
DOI: 10.1038/s41699-023-00384-2 - , , , , , , , , , :
Correlating Optical Microspectroscopy with 4×4 Transfer Matrix Modeling for Characterizing Birefringent Van der Waals Materials
In: Small Methods (2023)
ISSN: 2366-9608
DOI: 10.1002/smtd.202300618
2019
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Investigation of magnetic properties from a manganese-zinc-ferrite polymer bonded material
In: International Journal of Applied Electromagnetics and Mechanics 59 (2019), p. 97-104
ISSN: 1383-5416
DOI: 10.3233/JAE-171244
2018
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Investigation of magnetic properties from a manganese–zinc–ferrite polymer bonded material
In: International Journal of Applied Electromagnetics and Mechanics Pre-press (2018), p. 1-8
ISSN: 1383-5416
DOI: 10.3233/JAE-171244
2025
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Electroluminescent Behavior of Defects in 4H-SiC Light Emitting Diodes
48th MIPRO ICT and Electronics Convention, MIPRO 2025 (Opatija, 2. June 2025 - 6. June 2025)
In: Snjezana Babic, Zeljka Car, Marina Cicin-Sain, Pavle Ergovic, Tihana Galina Grbac, Vera Gradisnik, Stjepan Gros, Alan Jovic, Darko Jurekovic, Tihomir Katulic, Marko Koricic, Vedran Mornar, Juraj Petrovic, Karolj Skala, Dejan Skvorc, Vlado Sruk, Edvard Tijan, Joe S. Valacich, Neven Vrcek, Boris Vrdoljak (ed.): 2025 MIPRO 48th ICT and Electronics Convention 2025
DOI: 10.1109/MIPRO65660.2025.11132079
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Electronic devices based on the 2D material black phosphorus - layer-dependent properties
(Third Party Funds Single)
Project leader:
Term: 16. September 2021 - 15. September 2024
Acronym: HU 2827/2-1
Funding source: DFG-Einzelförderung / Sachbeihilfe (EIN-SBH)Two-dimensional materials show enormous potential concerning application in electronic devices because of their extraordinary properties. The utilization of materials of this kind, however, is accompanied by significant challenges as layer-dependent properties substantially determine potential device functionalities. These challenges are caused by an extensive lack of systematic studies investigating fabrication processes of electronic devices, including optimization as well as resulting electrical functionalities considering number of layers and anisotropy. Studies of this kind are intrinsically complex and defying as non-destructive methods for determining the number of layers of 2D materials integrated in electronic devices have to be combined and tuned with layer-dependent measurements of electrical properties. Within the framework of this project the influence of the number of layers on device properties of electronic devices based on the 2D material black phosphorous will be distinctly determined by a methodical combination of analytical reflectance spectroscopy and measurements of the electronic transport. For this purpose, various device architectures will be investigated with respect to their layer-dependent properties and anisotropy. These properties include both purely electronical and valleytronical aspects. The number of layers is ascertained by a custom-built optical method which exploits the properties of the spectral reflectance of the material. For varying device architectures various approaches like lateral and vertical contacting, different gate dielectrics, tunneling contacts as well as different surface passivations are utilized. As operating principle for fundamental and electrical characterization, field effect, Hall effect and valley-Hall effect are exploited. Obtained insights will contribute to a fundamental comprehension of properties of 2D materials with respect to their applicability in modern and future-based electronics. -
Physikalische Modellierung mikrospektroskopischer Messungen zur Charakterisierung von optischen Schichtsystemen
(Own Funds)
Project leader:
Term: since 1. May 2021