Jan Dick

2025

• Schwarz J., Dick J., Beuer S., Rommel M., Hutzler A.:
  Modeling the partially detected backside reflectance of transparent substrates in reflectance microspectroscopy
  In: Micron 198 (2025), p. 103878
  ISSN: 0968-4328
  DOI: 10.1016/j.micron.2025.103878

2025

• Kammel R., Dick J., May A., Rommel M., Schulze J.:
  600 °C Operation of a LDMOS Integrated on a 4H-SiC CMOS Platform
  48th MIPRO ICT and Electronics Convention, MIPRO 2025 (Opatija, 2. June 2025 - 6. June 2025)
  In: Snjezana Babic, Zeljka Car, Marina Cicin-Sain, Pavle Ergovic, Tihana Galina Grbac, Vera Gradisnik, Stjepan Gros, Alan Jovic, Darko Jurekovic, Tihomir Katulic, Marko Koricic, Vedran Mornar, Juraj Petrovic, Karolj Skala, Dejan Skvorc, Vlado Sruk, Edvard Tijan, Joe S. Valacich, Neven Vrcek, Boris Vrdoljak (ed.): 2025 MIPRO 48th ICT and Electronics Convention, MIPRO 2025 - Proceedings 2025
  DOI: 10.1109/MIPRO65660.2025.11131887
• Schwemmer B., Dick J., May A., Schulze J.:
  Empirical Modelling of Tunneling Processes in 4H-SiC Gated Pin-Diodes
  48th MIPRO ICT and Electronics Convention, MIPRO 2025 (Opatija, 2. June 2025 - 6. June 2025)
  In: Snjezana Babic, Zeljka Car, Marina Cicin-Sain, Pavle Ergovic, Tihana Galina Grbac, Vera Gradisnik, Stjepan Gros, Alan Jovic, Darko Jurekovic, Tihomir Katulic, Marko Koricic, Vedran Mornar, Juraj Petrovic, Karolj Skala, Dejan Skvorc, Vlado Sruk, Edvard Tijan, Joe S. Valacich, Neven Vrcek, Boris Vrdoljak (ed.): 2025 MIPRO 48th ICT and Electronics Convention, MIPRO 2025 - Proceedings 2025
  DOI: 10.1109/MIPRO65660.2025.11131817
• Ultsch S., Dick J., Schwarz J., Schulze J.:
  Electroluminescent Behavior of Defects in 4H-SiC Light Emitting Diodes
  48th MIPRO ICT and Electronics Convention, MIPRO 2025 (Opatija, 2. June 2025 - 6. June 2025)
  In: Snjezana Babic, Zeljka Car, Marina Cicin-Sain, Pavle Ergovic, Tihana Galina Grbac, Vera Gradisnik, Stjepan Gros, Alan Jovic, Darko Jurekovic, Tihomir Katulic, Marko Koricic, Vedran Mornar, Juraj Petrovic, Karolj Skala, Dejan Skvorc, Vlado Sruk, Edvard Tijan, Joe S. Valacich, Neven Vrcek, Boris Vrdoljak (ed.): 2025 MIPRO 48th ICT and Electronics Convention 2025
  DOI: 10.1109/MIPRO65660.2025.11132079
• Wimmer J., Dick J., Schulze J.:
  Fabrication and Electrical Characterization of Pure Boron on 4H-SiC Junctions
  48th MIPRO ICT and Electronics Convention, MIPRO 2025 (Opatija, 2. June 2025 - 6. June 2025)
  In: Snjezana Babic, Zeljka Car, Marina Cicin-Sain, Pavle Ergovic, Tihana Galina Grbac, Vera Gradisnik, Stjepan Gros, Alan Jovic, Darko Jurekovic, Tihomir Katulic, Marko Koricic, Vedran Mornar, Juraj Petrovic, Karolj Skala, Dejan Skvorc, Vlado Sruk, Edvard Tijan, Joe S. Valacich, Neven Vrcek, Boris Vrdoljak (ed.): 2025 MIPRO 48th ICT and Electronics Convention 2025
  DOI: 10.1109/MIPRO65660.2025.11132043

2024

• Ley M., Dick J., Schulze J.:
  Ab Initio Calculations to Determine Tunneling Parameters for 4H-SiC Tunneling Field-Effect Transistor Simulations
  47th ICT and Electronics Convention, MIPRO 2024 (Opatija, HRV, 20. May 2024 - 24. May 2024)
  In: Snjezana Babic, Zeljka Car, Marina Cicin-Sain, Dragan Cisic, Pavle Ergovic, Tihana Galinac Grbac, Vera Gradisnik, Stjepan Gros, Andrej Jokic, Alan Jovic, Darko Jurekovic, Tihomir Katulic, Marko Koricic, Vedran Mornar, Juraj Petrovic, Karolj Skala, Dejan Skvorc, Vlado Sruk, Marko Svaco, Edvard Tijan, Neven Vrcek, Boris Vrdoljak (ed.): 2024 47th ICT and Electronics Convention, MIPRO 2024 - Proceedings 2024
  DOI: 10.1109/MIPRO60963.2024.10569785
• May A., Rommel M., Baier L., Schraml M., Dick J., Jank M., Schulze J.:
  A 4H-SiC CMOS Technology enabling Smart Sensor Integration and Circuit Operation above 500 °C
  2024 Smart Systems Integration Conference and Exhibition, SSI 2024 (Hamburg, 16. April 2024 - 18. April 2024)
  In: 2024 Smart Systems Integration Conference and Exhibition, SSI 2024 2024
  DOI: 10.1109/SSI63222.2024.10740550