Johannes Bauer —

Microspectroscopy, which combines a microscope and a spectrometer, enables the investigation of a wide variety of layered structures, such as thin-film systems and two-dimensional materials. Through advanced modeling based on transfer-matrix methods, it is possible to determine parameters of individual layers, for example their thickness, in a non-destructive manner. The precise determination of layer thickness from reflectance measurements has already been demonstrated at LEB and IISB through prior work using various microspectroscopy systems.

In a preceding master’s thesis, the determination of the crystal axis orientation of black phosphorus (BP) flakes using linearly polarized light was demonstrated in principle. However, the accuracy of the results showed noticeable fluctuations. Within the scope of this research internship, additional BP flakes as well as flakes of the biaxial materials ReS₂ and MoO₃ will be investigated using the same approach, with the aim of identifying potential error sources and causes of the varying precision. In addition to the different samples, a custom-fabricated linear polarizer will be employed in order to exclude the original polarizer with an integrated quarter-wave plate as an additional source of uncertainty.
Since the theoretical methodology has already been developed in advance, the focus of this work lies on the experimental part, particularly on data acquisition and the analysis of possible uncertainties and error sources.

type:

research

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status:

finished

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