Abgeschlossen 2025FA: Determination of crystal axis orientation by microspectroscopy: analysis of accuracy and error sources
Johannes Bauer — Microspectroscopy, which combines a microscope and a spectrometer, enables the investigation of a wide variety of layered structures, such as thin-film systems and two-dimensional materials. Through advanced modeling based on transfer-matrix methods, it is possible to determine parameters of individual layers, for example their thickness, in a non-destructive manner. The precise determination […]Johannes Bauer — Microspectroscopy, which combines a microscope and a spectrometer, enables the investigation of a wide variety of layered structures, such as thin-film systems and two-dimensional materials. Through advanced modeling based on transfer-matrix methods, it is possible to determine parameters of individual layers, for example their thickness, in a non-destructive manner. The precise determination […]
